Allani, S.; Jupe, A.; Utz, Alexander; Schaal, C.; Rustom, A.; Kappert, H.; Vogt, H.:
Penetrating Nanoelectrodes for an Electrical Cell Interface on CMOS ASIC
In: Mikro-Nano-Integration : Beiträge des 7. GMM-Workshops, 22.-23. Oktober 2018 in Dortmund / VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik (Eds.). - 7. GMM-Workshop; Dortmund, Germany; 22.10.-23.10.2018 - Berlin: VDE Verlag, 2018 - (GMM-Fachbericht ; 92), pp. 7 - 12
2018Essay (Conference) in Conference proceedings
Faculty of Information, Media and Electrical Engineering » Institute of Applied Optics and Electronics
Related: 1 publication(s)
Title:
Penetrating Nanoelectrodes for an Electrical Cell Interface on CMOS ASIC
Author:
Allani, S.;Jupe, A.;Utz, AlexanderTH Köln
DHSB-ID
THK0067439
ORCID
0000-0002-1274-4563ORCID iD
SCOPUS
41961590500
Other
person connected with TH Köln
;Schaal, C.;Rustom, A.;Kappert, H.;Vogt, H.
Year of publication:
2018
Language of text:
English
Appears in
Mikro-Nano-Integration : Beiträge des 7. GMM-Workshops, 22.-23. Oktober 2018 in Dortmund
Conference
7. GMM-Workshop; Dortmund, Germany; 22.10.-23.10.2018
Editor:
VDE/VDI-Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik
Place of publication:
Berlin
Publisher:
VDE Verlag
Year of publication:
2018
in:
pp. 7 - 12
ISBN
978-1-5231-2672-9
ISBN
978-3-8007-4789-4
URN
urn:nbn:de:101:1-2022101316294094595160
In Series
GMM-Fachbericht
in:
Vol. 92
Type of resource:
Text
Access Rights:
metadata only access
Practice Partner:
No
Category:
Research
Part of statistic:
Not part of statistic